Title of article
Column-by-column compositional mapping by Z-contrast imaging
Author/Authors
Molina، نويسنده , , S.I. and Sales، نويسنده , , D.L. and Galindo، نويسنده , , P.L. and Fuster، نويسنده , , D. and Gonzلlez، نويسنده , , Y. and Alén، نويسنده , , B. and Gonzلlez، نويسنده , , L. M. Varela، نويسنده , , M. and Pennycook، نويسنده , , S.J.، نويسنده ,
Pages
5
From page
172
To page
176
Abstract
A phenomenological method is developed to determine the composition of materials, with atomic column resolution, by analysis of integrated intensities of aberration-corrected Z-contrast scanning transmission electron microscopy images. The method is exemplified for InAsxP1−x alloys using epitaxial thin films with calibrated compositions as standards. Using this approach we have determined the composition of the two-dimensional wetting layer formed between self-assembled InAs quantum wires on InP(0 0 1) substrates.
Keywords
High-resolution electron microscopy , Compositional mapping , Z-contrast imaging
Journal title
Astroparticle Physics
Record number
2049349
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