Title of article :
Comments on the paper “Bragg’s law diffraction simulations for electron backscatter diffraction analysis” by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood
Author/Authors :
Maurice، نويسنده , , Claire and Fortunier، نويسنده , , Roland and Driver، نويسنده , , Julian and Day، نويسنده , , Austin and Mingard، نويسنده , , Ken and Meaden، نويسنده , , Graham، نويسنده ,
Abstract :
This comment on the paper "Braggʹs Law diffraction simulations for electron backscatter diffraction analysis" by Kacher et al. explains the limitations in determining elastic strains using synthetic EBSD patterns.
ticular importance are those due to the accuracy of determination of the EBSD geometry projection parameters. Additional references and supporting information are provided.
Keywords :
Scanning electron microscope , EBSD , Calibration , strain
