Author/Authors :
Kacher، نويسنده , , Josh and Basinger، نويسنده , , Jay L. Adams ، نويسنده , , Brent L. and Fullwood، نويسنده , , David T.، نويسنده ,
Abstract :
A reply to Maurice et al.ʹs comment on "Braggʹs Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated.