Title of article :
Electron localization in granular materials
Author/Authors :
Dumpich، نويسنده , , G. and Carl، نويسنده , , A. and Mikitisin، نويسنده , , P.، نويسنده ,
Abstract :
We have investigated the structural and electrical properties of granular Pd/C as well as granular Au/C thin firms. As revealed by transmission electron microscopy the films consist of small metallic clusters of either Pd or Au embedded within amorphous carbon. Films with low metal volume fraction x consist of structurally isolated clusters and show exponential resistance behavior. Above the so-called percolation threshold xp metallic clusters form a percolating network rendering metallic conductivity. For metallic films with x ≫ xp we observe two dimensional (2d) electronic transport behavior at low temperatures via small additional contributions to the Boltzmann-resistance as arising from weak electron localization (WEL) and enhanced electron-electron interaction (EEI). When approaching the percolation threshold these additional resistance contributions grow in absolute magnitude and the 2d transport behavior changes to 3d-behavior close to xp. For both cases resistance as well as magnetoresistance data can be well explained using theories for WEL and EEI in 2d and 3d respectively.
Keywords :
Transmission electron microscopy , Percolation threshold , granular materials
Journal title :
Astroparticle Physics