Title of article :
Preparation of damage-free glass TEM specimens
Author/Authors :
Kestel، نويسنده , , Bernard J، نويسنده ,
Abstract :
A jet polishing technique to chemically thin glass specimens for transmission electron microscopy (TEM) after a preliminary mechanical dimpling step has been developed. Slightly modified commercial equipment is used with automatic optical termination of the polishing process to produce foils exhibiting large, high quality, electron transparent regions.
Keywords :
Damage-free jet polishing , Glass NBS and ARM TEM specimens , Automatic polishing termination
Journal title :
Astroparticle Physics
