Title of article
A comparison between three-dimensional and two-dimensional grain boundary plane analysis
Author/Authors
Randle، نويسنده , , Valerie and Davies، نويسنده , , Helen، نويسنده ,
Pages
10
From page
153
To page
162
Abstract
An EBSD-based methodology for assessment of grain boundary planes, in particular Σ3 boundaries in face-centred cubic materials, has recently been devised. The method is based on trace analysis in a single, two-dimensional section rather than the more arduous three-dimensional method. The paper reports a data set of grain boundary planes in alpha-brass, mainly Σ3s, which have been analysed using both methods so that they can be compared and a recommendation made about the usefulness of the new method. It is shown that the new, two-dimensional method is a valuable tool in the analysis of grain boundary geometry, especially when used in conjunction with v/vm, a parameter for assessing the proximity to the misorientation reference structure.
Keywords
Annealing twins , Electron backscatter diffraction , ?3 CSLs , Grain boundary plane
Journal title
Astroparticle Physics
Record number
2051271
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