Title of article :
Layer-doubling method in ADF-STEM image simulation
Author/Authors :
Mitsuishi، نويسنده , , K. and Takeguchi، نويسنده , , M. and Toda، نويسنده , , Y. and Furuya، نويسنده , , K.، نويسنده ,
Abstract :
A layer-doubling method developed in LEED calculation is applied to the ADF-STEM image simulation. This approach makes it possible to simulate image intensities of systems having a repeated slab structure, such as embedded precipitates or defects, with a much higher efficiency because it does not require the diagonalization of repeated slabs. As a simple example of this method, channeling effects are calculated for a system with embedded crystalline displaced slabs for various different slab thicknesses.
Keywords :
image simulation , Electron diffraction and elastic scattering theory , Scanning transmission electron microscopy (STEM)
Journal title :
Astroparticle Physics
