Author/Authors :
Yamazaki، نويسنده , , T and Nakanishi، نويسنده , , N and Re?nik، نويسنده , , A and Kawasaki، نويسنده , , M and Watanabe، نويسنده , , K and ?eh، نويسنده , , M and Shiojiri، نويسنده , , M، نويسنده ,
Abstract :
Sb2O3-doped ZnO crystals including inversion boundaries were investigated by high-resolution high-angle annular-dark field (HAADF) scanning transmission electron microscopy (STEM). The images were analysed with the aid of the image simulation based on Bethe method and also the retrieval processing using deconvolution. Utility of these two approaches for the HAADF–STEM analysis is discussed.
Keywords :
STEM , HAADF , Sb2O3-doped ZnO , Bethe method , Deconvolution
