Author/Authors :
Frazer، نويسنده , , Bradley H. and Girasole، نويسنده , , Marco and Wiese، نويسنده , , Lisa M. and Franz، نويسنده , , Torsten and Stasio، نويسنده , , Gelsomina De Stasio and G. Margaritondo، نويسنده ,
Abstract :
Several X-ray PhotoElectron Emission spectroMicroscopes (X-PEEMs) exist around the world at this time. We present recent performance and resolution tests of one of them, the Spectromicroscope for PHotoelectron Imaging of Nanostructures with X-rays (SPHINX) X-PEEM, installed at the University of Wisconsin Synchrotron Radiation Center. With this state-of-the-art instrument we demonstrate chemical analysis capabilities on conducting and insulating specimens of diverse interests, and an unprecedented lateral resolution of 10 nm with monochromatic X-rays and 7.2 nm with ultraviolet illumination.