Title of article :
On the importance of fifth-order spherical aberration for a fully corrected electron microscope
Author/Authors :
Chang، نويسنده , , L.Y. and Kirkland، نويسنده , , A.I. and Titchmarsh، نويسنده , , J.M.، نويسنده ,
Pages :
6
From page :
301
To page :
306
Abstract :
Next generation aberration correctors will not only eliminate the third-order spherical aberration, but also improve the information limit by correction of chromatic aberration. As a result of these improvements, higher order aberrations, which have largely been neglected in image analysis, will become important. In this paper, we concern ourselves with situations where sub-إ resolution can be achieved, and where the third-order spherical aberration is corrected and the fifth-order spherical aberration is measurable. We derive formulae to explore the maximum value of the fifth-order spherical aberration for directly interpretable imaging and discuss the optimum imaging conditions and their applicable range.
Keywords :
C s and C c -corrected microscope , Phase contrast theory
Journal title :
Astroparticle Physics
Record number :
2051844
Link To Document :
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