Author/Authors :
Potapov، نويسنده , , P.L. and Lichte، نويسنده , , H. and Verbeeck، نويسنده , , J. and van Dyck، نويسنده , , D.، نويسنده ,
Abstract :
Using the combination of an electron biprism and an energy filter, the coherence distribution in an inelastically scattered wave-field is measured. It is found that the degree of coherence decreases rapidly with increasing distance between two superimposed points in the object, and with increasing energy-loss. In a Si sample, coherence of plasmon scattering increases in vacuum with the distance from the edge of the sample.