Laue asterism and high temperature deformation of iron doped NiAl single crystal

Samples of iron doped NiAl single crystal were uniaxially compressed at temperatures up to 1673 K and a strain rate of 10−3 s−1, and were then studied with Laue back reflection method based on a STOE imaging plate diffraction system (IPDS). Asterism was observed for every deformed sample, which is an indication of orientation distribution and lattice distortion. A single Taylor axis can often, though not always be determined locally. However, different Taylor axes have been observed within a single sample, which could refer to multiple slip activated by plastic deformation. Possible slip systems can be deduced by studying Laue asterism combined with other measurements such as surface slip trace analysis. Furthermore, structure refinement has been carried out with the integrated intensity of distorted reflections.