Title of article :
Semi-insulating properties control by cvd process modelling
Author/Authors :
Cordier، نويسنده , , C. and Dehan، نويسنده , , E. and Scheid، نويسنده , , E. and Duverneuil، نويسنده , , P.، نويسنده ,
Pages :
5
From page :
30
To page :
34
Abstract :
SIPOS films were deposited from a mixture of disilane and nitrous oxide in a tubular hot wall reactor and their thickness and oxygen content were measured. A detailed chemical mechanism is proposed to represent homogeneous and heterogeneous reactions and the CVD2 model taking into account hydrodynamics and mass transfer with chemical reactions is adjusted to SIPOS deposition. A good agreement between experimental results and model predictions for various operating conditions is obtained. By the use of CVD2 model, the main chemical pathways are identified and an extensive comprehension of the experimental evidences is possible.
Keywords :
Silicon oxide , Deposition , Modelisation , Silicon
Journal title :
Astroparticle Physics
Record number :
2063835
Link To Document :
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