Author/Authors :
Berchenko، نويسنده , , N.N. and Kurbanov، نويسنده , , K.R. and Nikiforov، نويسنده , , A.Yu. and Korovin، نويسنده , , A.V.، نويسنده ,
Abstract :
It has been demonstrated that variable magnetic field Hall measurements for n-Hg1 − xCdxTe samples in intrinsic and extrinsic conductivity regions enable the semiquantitative identification and characterization of extended defects of two topological arrangements with either connected or isolated conducting inclusions.
