Author/Authors :
Suematsu، نويسنده , , H. and Yamauchi، نويسنده , , H. and Yano، نويسنده , , T. and Ii، نويسنده , , H. and Tanaka، نويسنده , , Y.، نويسنده ,
Abstract :
The microstructure of Ag-sheathed (Bi,Pb)2Sr2Ca2Cu3Ox tapes is quantitatively investigated by transmission electron microscopy and electron probe microanalysis. Volume fraction of the second phases decreases as the critical current density of the wire increases. The relationship between the microstructure and the critical current density is discussed.
Keywords :
Ag-sheathed tapes , electron probe microanalysis , volume fraction , Current Density
