Author/Authors :
Shigetani، نويسنده , , Hisashi and Fujimoto، نويسنده , , Masayuki and Sugimura، نويسنده , , Wataru and Matsui، نويسنده , , Yoshio and Tanaka، نويسنده , , Junzo، نويسنده ,
Abstract :
BaTiO3(BTO) thin films were grown by an MBE method using an oxygen radical source. BaO and TiO2 layers were alternately-deposited on a SrTiO3 (001) substrate (STO), and the structure of the thin film obtained was evaluated by X-ray diffraction, reflection high energy electron diffraction and transmission electron microscopy. The BTO thin films were epitaxially grown and oriented in the (001) direction. The lattice constants of the thin film varied with distance from the interface of BTO and STO. Near the interface, the a-value was shorter than that for bulk BTO while the c-value was longer than that for bulk BTO.
