Title of article
Spectral microphotoluminescence investigation of impurity-defect interaction in CdTe with high spatial resolution
Author/Authors
Gukasyan، نويسنده , , A. V. Kvit، نويسنده , , A. and Klevkov، نويسنده , , Y. and Kazaryan، نويسنده , , S.، نويسنده ,
Pages
3
From page
87
To page
89
Abstract
The microphotoluminescence (MPL) technique is applied to investigate the behavior of residual impurities in the nearest vicinity of extended defects in polycrystalline CdTe. The MPL spectra variation is associated with impurity-defect interaction and their complex formation. The high purity of CdTe samples used in experiments helped to separate the influence of residual impurities, native defects and their complexes on MPL properties of the material.
Keywords
Microphotoluminescence , Polycrystalline CdTe , Spatial resolution
Journal title
Astroparticle Physics
Record number
2065908
Link To Document