Spectral microphotoluminescence investigation of impurity-defect interaction in CdTe with high spatial resolution

The microphotoluminescence (MPL) technique is applied to investigate the behavior of residual impurities in the nearest vicinity of extended defects in polycrystalline CdTe. The MPL spectra variation is associated with impurity-defect interaction and their complex formation. The high purity of CdTe samples used in experiments helped to separate the influence of residual impurities, native defects and their complexes on MPL properties of the material.