Title of article
New results in sublimation growth of the SiC epilayers
Author/Authors
Savkina، نويسنده , , N.S. and Lebedev، نويسنده , , A.A. and Davydov، نويسنده , , D.V. and Strel’chuk، نويسنده , , A.M. and Tregubova، نويسنده , , A.S. and Yagovkina، نويسنده , , M.A.، نويسنده ,
Pages
3
From page
165
To page
167
Abstract
In this work it has been shown that an optimized technology of sublimation epitaxial growth can be used to obtain structural perfection layers with concentration of uncompensated donors NdNa∼1×1015 cm−3 and the hole diffusion length of ∼2.5 μm.
Keywords
6H?SiC , sublimation growth , diffusion length , Concentration
Journal title
Astroparticle Physics
Record number
2067411
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