In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals

A novel X-ray diffraction method is introduced, which enables a complete peak shape analysis for a set of distinct diffraction peaks arising from one and the same embedded grain within the bulk of a polycrystalline metal. From the 2θ variation and the mosaic spread of the peaks, information about the dislocation structures formed during the deformation can be extracted in a much more direct way than previously possible. The method is based on the use of high energy X-rays and a multi-grain indexing program for identification of individual grains within a polycrystal. In a feasibility study, one aluminum grain is studied in situ during tensile deformation up to 4.5%.