Author/Authors :
Firlej، نويسنده , , L. and Zahab، نويسنده , , Lucien A. and Brocard، نويسنده , , F. and Bernier، نويسنده , , P.، نويسنده ,
Abstract :
Electrical studies of C70 thin films are presented. The influence of sample annealing in vacuum and of exposition to air is analyzed and compared with transport properties of C60 films submitted to the same treatment. The temperature dependence of the film resistivity around a structural phase transition at T=345 K is interpreted in the light of a multiphase composition of C70 samples.
