Title of article :
Penetration depth in oxygen depleted YBCO thin films
Author/Authors :
Lee، نويسنده , , JuYoung and Paget، نويسنده , , Kathleen and Lemberger، نويسنده , , Thomas R. and Foltyn، نويسنده , , Steve R. and Wu، نويسنده , , Xindi، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1995
Pages :
2
From page :
1605
To page :
1606
Abstract :
The effect of oxygen depletion on YBCO film is investigated via penetration depth measurements. The T-dependence is measured in high precision for each oxygen concentration. λ(T/Tc)/λ(0) vs. T/Tc for our films is almost identical for different oxygen content. For a fully oxygenated film, it agrees extremely well with the crystal data for T > 25K. 1/λ2(0) which is proportional to superfluid density is reduced by factor 10 as Tc is reduced to 48K. Tc vs. 1/λ2(0) in our result basically reproduces μSR result on bulk by Uemura et al. except the approximately 25% smaller value in 1/λ2(0) of film, which can be interpreted as impurity effect in a d-wave superconductor.
Journal title :
Synthetic Metals
Serial Year :
1995
Journal title :
Synthetic Metals
Record number :
2069487
Link To Document :
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