• Title of article

    Thermal annealing effects of C22-Quinolium(TCNQ) Langmuir-Blodgett films

  • Author/Authors

    Kim، نويسنده , , Tae-Wan and Lee، نويسنده , , Sang-Kug and Song، نويسنده , , Min-Jong and Shin، نويسنده , , Dong-Myung and Kwon، نويسنده , , Young-Soo and Kang، نويسنده , , Dou-Yol and Jin، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1995
  • Pages
    2
  • From page
    2029
  • To page
    2030
  • Abstract
    Thermal annealing effects of C22-Quinolium(TCNQ) LB films were investigated through a study of frequency-dependent dielectric properties. Thermal annealing was performed in the range of 20∼240 °C. Thickness measurement by ellipsometry shows that there is a thickness drop near 100 °C, which is supposed to be due to a softening of the alkyl chains. The film thickness above 120 °C becomes ∼ 20 % of the room-temperature value. Frequency-dependent dielectric properties show that there are two characteristics dispersions; one is a dispersion occuring ∼ 1 MHz coming from the electric polarization of the molecules. The other one is an interfacial polarization effect below ∼ 1 kHz when the annealing temperature is above 80 °C.
  • Journal title
    Synthetic Metals
  • Serial Year
    1995
  • Journal title
    Synthetic Metals
  • Record number

    2069665