Title of article :
Mass spectrometric characterization of ablated thin polybithiophene films using photoionization
Author/Authors :
Sauerland، نويسنده , , Volker and Schindler، نويسنده , , Ralph N.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1995
Pages :
4
From page :
191
To page :
194
Abstract :
Thin electrochemically generated polybithiophene film material was CO2-laser ablated from the electrode, transported into the ion source of a time-of-flight mass spectrometer by an expanding Ar jet, and photoionized using a dye laser in the range 240 < λ < 252 nm. The spectra obtained are dominated by strong contributions from oligomers, especially ions containing six or eight thiophene units. The identity of the starting 2,2′-bithienyl monomer is clearly preserved in the ablated oligomers. Ion distributions are affected by the supporting electrolyte used during polymerization and by the charge passed through the electrode.
Keywords :
Photoionization , Polybithiophene , Spectroscopy , films
Journal title :
Synthetic Metals
Serial Year :
1995
Journal title :
Synthetic Metals
Record number :
2069868
Link To Document :
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