Title of article :
Particle induced X-ray emission (PIXE) and radiochemistry study of poly(pyrrole) doped with toluenesulfonate or polystyrenesulfonate anions
Author/Authors :
Stéphen، نويسنده , , O. and Carrier، نويسنده , , M. and Page، نويسنده , , J. and Frontier، نويسنده , , J.P. and Trouslard، نويسنده , , P.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1995
Pages :
5
From page :
181
To page :
185
Abstract :
Poly(pyrrole) films have been prepared at constant current using two different doping ions (i.e., toluenesulfonate ions or polystyrenesulfonate ions). Particle induced X-ray emission experiments show that incorporation is reversible with toluenesulfonate anions: when the films are reduced in 0.1 mol dm−3 KNO3 solutions, all the anions incorporated during the synthesis are released. With polystyrenesulfonate ions, however, the incorporation is irreversible. It is likely that such films have cation exchanging properties. This phenomenon has been studied using barium ions, the incorporation of which was monitored using a radiochemical method.
Keywords :
Particle induced X-ray emission , radiochemistry , Doping , Poly(pyrrole)
Journal title :
Synthetic Metals
Serial Year :
1995
Journal title :
Synthetic Metals
Record number :
2069957
Link To Document :
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