Author/Authors :
Brütting، نويسنده , , W. and Buchwald، نويسنده , , E. and Egerer، نويسنده , , G. and Meier، نويسنده , , M. and Zuleeg، نويسنده , , K. and Schwoerer، نويسنده , , M.، نويسنده ,
Abstract :
Charge carrier injection and transport in light emitting devices based on poly-phenylene-vinylene are investigated by internal photoemission and thermally stimulated currents. The barrier heights for electron injection depend very weakly on the metal work function, indicating a significant influence of surface states or interfacial layers. Trap states in PPV are detected with trap energies ranging from 0.1eV in fresh samples to 0.9eV in aged samples.
