Spectroscopic study of the conversion of the precursor into poly(p-phenylene vinylene) films

The conversion of the precursor into poly(p-phenylene-vinylene) PPV films has been studied bv X ray photoelectron spectroscopy (XPS) and electron spin resonance (ESR) technique in the temperature range from 25 to 300°C. XPS results revealed that the PPV films may contain impurities on their surface depending on the nature of the precursor used while ESR analysis showed a progressive disappearance of the radicals formed on the sulfur sites upon heating. These complementary studies allowed us to determine the optimum rate of the conversion process.