Influence of Fabrication Conditions on the Electrical Behaviour of Polymer Schottky Diodes

Evidence is presented which shows that anomalies in the I–V characteristics of Schottky diodes formed from electrodeposited poly(3methylthiophene) are related to the time films are held under vacuum prior to deposition of the rectifying aluminium electrode. For short times (~15 mins) a plateau appears in the forward bias characteristic which disappears leading to a significant voltage offset as the device ages or is driven into high forward bias.