• Title of article

    Degradation process in polymeric electroluminescent devices

  • Author/Authors

    Do، نويسنده , , Lee-Mi and Choi، نويسنده , , Kang-Hoon and Lee، نويسنده , , Hyang-Mok and Hwang، نويسنده , , Do-Hoon and Jung، نويسنده , , Sang-Don and Shim، نويسنده , , Hong-Ku and Zyung، نويسنده , , Taehyoung، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1997
  • Pages
    2
  • From page
    121
  • To page
    122
  • Abstract
    To investigate the initial degradation process in polymeric electroluminescent (EL) devices, in situ measurement of photoluminescence image change was carried out. The Al electrode was sunk or protruded during the device operation. Formation of the dented dark spot is observed by using an atomic force microscope and a scanning electron microscope, which is the critical factor of the degradation.
  • Keywords
    Degradation , electroluminescence
  • Journal title
    Synthetic Metals
  • Serial Year
    1997
  • Journal title
    Synthetic Metals
  • Record number

    2071626