Title of article
Change of the depth profile of a light-emitting zone in organic EL devices with their degradation
Author/Authors
Matsumura، نويسنده , , Michio and Jinde، نويسنده , , Yukitoshi، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1997
Pages
2
From page
197
To page
198
Abstract
The light-emitting zone in organic electroluminescent (EL) devices having the aluminum-hydroxyquinoline complex (ALQ)/diamine (TPD) junction was estimated from the analysis of the EL spectra. The zone distributed to the depth of about 20 nm from the interface at the initial performance. The zone however was found to shrink toward the ALQ/TPD interface as the devices degraded. From the results, it was concluded that the ALQ/TPD interface is responsible for the degradation, especially at the initial stage.
Keywords
Light-emitting devices , electroluminescence , Degradation
Journal title
Synthetic Metals
Serial Year
1997
Journal title
Synthetic Metals
Record number
2071646
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