Title of article :
AFM studies of polypyrrole film surface morphology II. Roughness characterization by the fractal dimension analysis
Author/Authors :
Silk، نويسنده , , Toomas and Hong، نويسنده , , Qi and Tamm، نويسنده , , Jüri and Compton، نويسنده , , Richard G.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1998
Pages :
7
From page :
65
To page :
71
Abstract :
The fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for films both as-prepared and after potentiodynamic cycling in various supporting electrolytes is presented and discussed.
Keywords :
Polypyrrole , atomic force microscopy , surface morphology , Fractal dimensions
Journal title :
Synthetic Metals
Serial Year :
1998
Journal title :
Synthetic Metals
Record number :
2071745
Link To Document :
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