Author/Authors :
Djurado، نويسنده , , D. and Nicolau، نويسنده , , Y.F. and Rannou، نويسنده , , P. and Luzny، نويسنده , , Wilfred W. and Samuelsen، نويسنده , , E.J. and Terech، نويسنده , , P. and Bee، نويسنده , , M and Sauvajol، نويسنده , , J.L.، نويسنده ,
Abstract :
The structures of free standing films of polyaniline (PAni) protonated by camphorsulfonic acid (CSA) are characterized by different scattering techniques: WAXD, IINS, SANS and SEM. In this way, we could investigate the complex structural arrangement of these films at different length scales. It is shown that a unique description of structure and microstructure of such films is not realistic since they tightly depend on the conditions of preparation and processing. This contribution gives an account of the most important structural data obtained on films prepared in Grenoble France during the four last years.
Keywords :
Polyaniline and derivatives , X-ray diffraction , neutron scattering , X-Ray scattering
