Title of article
Imaging of electrical features in organic thin films by scanning maxwell-stress microscopy
Author/Authors
Shin، نويسنده , , H.K. and Inoue، نويسنده , , T. and Kwon، نويسنده , , Y.S. and Yokoyama، نويسنده , , H.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1999
Pages
2
From page
1579
To page
1580
Abstract
The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. Here we report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films prepared by the Langmuir-Blodgett technique.
Keywords
Scanning Maxwell-stress microscopy , Ion complex , Langmuir-Blodgett techniques
Journal title
Synthetic Metals
Serial Year
1999
Journal title
Synthetic Metals
Record number
2072764
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