Title of article :
Oriented thin films of p-nitrophenyl nitroxyl nitroxide radical
Author/Authors :
Fraxedas، نويسنده , , J. and Caro، نويسنده , , J. and Santiso، نويسنده , , J. To-Figueras، نويسنده , , A. and Jürgens، نويسنده , , O. and Rovira، نويسنده , , C. and Veciana، نويسنده , , J.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1999
Pages :
2
From page :
2298
To page :
2299
Abstract :
Thin films (thickness ~ 2 μm) of the molecular organic radical p-nitrophenyl nitroxyl nitroxide (p-NPNN) have been obtained by evaporating different crystallographic phases (α, β and γ) of the p-NPNN precursor in vacuum on glass and cleaved NaCl(001) substrates. The films crystallize in the α-phase (monoclinic) and show a high degree of orientation of the c*-axis perpendicular to the substrate, independently of the precursor phase. The films undergo a spontaneous phase transition, from α to β, under certain conditions.
Keywords :
Structural phase transitions , Evaporation and sublimation
Journal title :
Synthetic Metals
Serial Year :
1999
Journal title :
Synthetic Metals
Record number :
2073117
Link To Document :
بازگشت