• Title of article

    Electronic properties of structurally modified C60 films

  • Author/Authors

    Henderson، نويسنده , , K. and Chambers، نويسنده , , G. and Byrne، نويسنده , , H.J.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 1999
  • Pages
    2
  • From page
    2360
  • To page
    2361
  • Abstract
    When thin films are exposed to DEA vapour, the absorption features of C60 shift to the red, most notably the charge-transfer exciton features at ~475nm and 525nm. Raman shows that the features of the exposed film have been shifted relative to those of the pristine film and that the film is stable against the characteristic C60 photo-transformation. The behaviour is reminiscent of that observed in annealed C60 films, which was shown to be the result of a partial conversion of the film to a hcp structure. That the effect of exposure to the vapour is structural is suggested by the observed microscopic cracking of the film, and is confirmed by x-ray diffraction. It is shown that there is a photostable form of solid C60 whose electronic properties differ significantly from those of fcc films.
  • Keywords
    Diffraction and scattering , infrared and Raman spectroscopy , Polycrystalline thin films , Optical absorption and emission spectroscopy , Fullerenes and derivatives , X-ray emission
  • Journal title
    Synthetic Metals
  • Serial Year
    1999
  • Journal title
    Synthetic Metals
  • Record number

    2073143