Title of article
Electronic properties of structurally modified C60 films
Author/Authors
Henderson، نويسنده , , K. and Chambers، نويسنده , , G. and Byrne، نويسنده , , H.J.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1999
Pages
2
From page
2360
To page
2361
Abstract
When thin films are exposed to DEA vapour, the absorption features of C60 shift to the red, most notably the charge-transfer exciton features at ~475nm and 525nm. Raman shows that the features of the exposed film have been shifted relative to those of the pristine film and that the film is stable against the characteristic C60 photo-transformation. The behaviour is reminiscent of that observed in annealed C60 films, which was shown to be the result of a partial conversion of the film to a hcp structure. That the effect of exposure to the vapour is structural is suggested by the observed microscopic cracking of the film, and is confirmed by x-ray diffraction. It is shown that there is a photostable form of solid C60 whose electronic properties differ significantly from those of fcc films.
Keywords
Diffraction and scattering , infrared and Raman spectroscopy , Polycrystalline thin films , Optical absorption and emission spectroscopy , Fullerenes and derivatives , X-ray emission
Journal title
Synthetic Metals
Serial Year
1999
Journal title
Synthetic Metals
Record number
2073143
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