Investigations of fullerene thin films with in situ FTIR spectroelectrochemistry

In situ internal reflection FTIR spectroscopy measurements using the attenuated total reflection (ATR) method were made during electrochemical reduction of fullerene films. Thin C60 films were prepared either by solution casting from a fullerene-CH2Cl2 solution or by molecular beam epitaxy technique. The spectroscopic characterization of the film structure was made for the different redox processes in organic electrolyte media during potential cycling in a temperature controlled spectroelectrochemical cell using a Ge crystal as working electrode. The IR spectra obtained during the redox processes of the fullerene films in different electrolyte solutions are discussed.