Optical beam deflection study of indium-hexacyanoferrate films

Optical beam deflection technique was employed to follow the ion transport and ion exchange processes taking place in the course of redox transformations of indium-hexacyanoferrate surface layers. The data analysis by the help of a convolution method attested that the principal charge compensating ions are cations and the contribution of anions to the charge neutralization inside the film is less than a few percents in the range [0, 0.85 V].