Author/Authors :
Parkhutik، نويسنده , , V and Fenollosa، نويسنده , , R and Matveeva، نويسنده , , E and Nguyen، نويسنده , , T.P and Rendu، نويسنده , , P. Le and Tran، نويسنده , , V.H، نويسنده ,
Abstract :
The electrical impedance of thin films of phenylene–vinylene oligomer (PVO) vacuum-deposited on to porous silicon (PS) substrates is studied in a wide range of temperatures (10–350 K) and ac electric field frequencies. It is shown that the PVO films are susceptible to the influence of the environment — its conductivity decreases orders of magnitude when the atmosphere is evacuated. The data of measurements are analyzed using the physical model which implies the participation of both PVO and PS layers in the electrical conductivity process.