Title of article
Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy
Author/Authors
Reis، نويسنده , , F.T. and Mencaraglia، نويسنده , , D. and Oould Saad، نويسنده , , S. and Séguy، نويسنده , , I. and Oukachmih، نويسنده , , M. and Jolinat، نويسنده , , P. and Destruel، نويسنده , , P.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2003
Pages
5
From page
33
To page
37
Abstract
Metal-substituted phthalocyanine (MPc) thin films as zinc- or copper-phthalocyanine are often used as charge injection layers for organic electroluminescent or photovoltaic devices. It is then important to characterize their electronic defect density and
Keywords
Admittance spectroscopy , Metal-substituted phthalocyanine , Optoelectronic properties
Journal title
Synthetic Metals
Serial Year
2003
Journal title
Synthetic Metals
Record number
2078671
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