Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy
Author/Authors :
Reis، نويسنده , , F.T. and Mencaraglia، نويسنده , , D. and Oould Saad، نويسنده , , S. and Séguy، نويسنده , , I. and Oukachmih، نويسنده , , M. and Jolinat، نويسنده , , P. and Destruel، نويسنده , , P.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Pages :
5
From page :
33
To page :
37
Abstract :
Metal-substituted phthalocyanine (MPc) thin films as zinc- or copper-phthalocyanine are often used as charge injection layers for organic electroluminescent or photovoltaic devices. It is then important to characterize their electronic defect density and
