Depth profiling of the degradation of OC1OC10-PPV monitored by positron beam analysis
Author/Authors :
Javier Garcia de Alba Garcia، نويسنده , , A. and Schut، نويسنده , , H. and Siebbeles، نويسنده , , L.D.A. and van Veen، نويسنده , , A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Pages :
5
From page :
43
To page :
47
Abstract :
The Doppler broadening of annihilation radiation (DBAR) technique and UV-Vis photo-absorption spectroscopy were used to monitor the photo-oxidation of thin films (200 nm) of OC1OC10-PPV. Samples were exposed in air to a 308 nm excimer laser and a commerci
