Title of article
Depth profiling of the degradation of OC1OC10-PPV monitored by positron beam analysis
Author/Authors
Javier Garcia de Alba Garcia، نويسنده , , A. and Schut، نويسنده , , H. and Siebbeles، نويسنده , , L.D.A. and van Veen، نويسنده , , A.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2003
Pages
5
From page
43
To page
47
Abstract
The Doppler broadening of annihilation radiation (DBAR) technique and UV-Vis photo-absorption spectroscopy were used to monitor the photo-oxidation of thin films (200 nm) of OC1OC10-PPV. Samples were exposed in air to a 308 nm excimer laser and a commerci
Keywords
Degradation , PPV , Polymer , Positron
Journal title
Synthetic Metals
Serial Year
2003
Journal title
Synthetic Metals
Record number
2078680
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