Title of article
Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films
Author/Authors
Losurdo، نويسنده , , M. and Giangregorio، نويسنده , , M.M. and Capezzuto، نويسنده , , P. and Bruno، نويسنده , , G. and Babudri، نويسنده , , F. and Colangiuli، نويسنده , , D. and Farinola، نويسنده , , G.M. and Naso، نويسنده , , F.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2003
Pages
5
From page
49
To page
53
Abstract
The correlation between the optical properties and microstructural parameters of organic semiconductor polymeric thin films is investigated by spectroscopic ellipsometry. Different poly(arylenephenylene)-based films have been deposited by spincoating. The
Keywords
spectroscopic ellipsometry , Organic polymeric films , Optical properties , Conjugated Polymers
Journal title
Synthetic Metals
Serial Year
2003
Journal title
Synthetic Metals
Record number
2078687
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