Title of article :
Application of spectroscopic ellipsometry to probe the environmental and photo-oxidative degradation of poly(p-phenylenevinylene) (PPV)
Author/Authors :
Kumar، نويسنده , , Satyendra and Biswas، نويسنده , , A.K. and Shukla، نويسنده , , V.K. and Awasthi، نويسنده , , A. and Anand، نويسنده , , R.S. and Narain، نويسنده , , J.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Pages :
3
From page :
751
To page :
753
Abstract :
We report on the spectroscopic ellipsometry (SE) characterization and modeling of the light and environmental induced degradation of Poly(p-phenylenevinylene) (PPV) prepared by xanthate precursor route. We find a decrease in the refractive index as well a
Keywords :
MODELING , Degradation , ellipsometry , Poly(p-phenylenevinylene)
Journal title :
Synthetic Metals
Serial Year :
2003
Journal title :
Synthetic Metals
Record number :
2079618
Link To Document :
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