Title of article
Dark spot formation relative to ITO surface roughness for polyfluorene devices
Author/Authors
Liu، نويسنده , , Gao and Kerr، نويسنده , , John B and Johnson، نويسنده , , Steve، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2004
Pages
6
From page
1
To page
6
Abstract
The failure behaviors of ITO/PEDOT;PSS/polyfluorene/Al devices are different depending on the surface roughness of the sputtered ITO anode film. The spikes on ITO surface are responsible for the initial local shorts of the device, which develop into dark
Keywords
OLED , Failure mechanism , ITO surface , Dark spot , Interface
Journal title
Synthetic Metals
Serial Year
2004
Journal title
Synthetic Metals
Record number
2080408
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