Title of article :
Ultraviolet photoemission and electron loss spectroscopy of oligothiophene films
Author/Authors :
Chandekar، نويسنده , , Norman A. and Whitten، نويسنده , , J.E.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2005
Abstract :
Ultraviolet photoelectron spectroscopy (UPS) has been used to study the evolution of the valence electronic states as a function of conjugation length for thiophene, bithiophene, terthiophene, and sexithiophene films deposited in-vacuum on gold substrates
Keywords :
Oligothiophenes , Polythiophene and derivatives , Semiconducting surfaces , Photoemission , Electron Energy Loss Spectroscopy , Electronic structure
Journal title :
Synthetic Metals
Journal title :
Synthetic Metals
