Title of article :
Measurement of molecular order and orientation in nanoscale organic films
Author/Authors :
Watts، نويسنده , , B. and Thomsen، نويسنده , , L. and Dastoor، نويسنده , , P.C.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2005
Pages :
4
From page :
21
To page :
24
Abstract :
Self-assembled monolayers (SAMs) have, in recent years, attracted much interest for surface modification, surface coatings and as interfacial coupling agents. X-ray photoelectron spectroscopy (XPS) and carbon K-edge near edge X-ray absorption fine structu
Keywords :
Organic/inorganic interfaces , Coatings , X-ray absorption spectroscopy , Polycrystalline surfaces
Journal title :
Synthetic Metals
Serial Year :
2005
Journal title :
Synthetic Metals
Record number :
2081412
Link To Document :
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