Title of article :
Spin-coated conductive polymer film resistivity measurement using the TLM method
Author/Authors :
Giraudet، نويسنده , , L. and Fauveaux، نويسنده , , S. and Simonetti، نويسنده , , O. and Petit، نويسنده , , C. and Blary، نويسنده , , K. and Maurel، نويسنده , , T. and Belkhir، نويسنده , , A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2006
Pages :
5
From page :
838
To page :
842
Abstract :
Organic conductors such as PEDOT:PSS are commonly used for the fabrication of OLEDs or OTFT transistors. Conductivity measurement is mandatory to improve both material composition and process parameters, and to allow device and circuit modeling. Film deposition using spin-coating on circular TLM electrode structures is a straightforward method for extracting both the film resistance and the contact resistivity, providing an accurate model is used. A practical measurement procedure is described in detail and applied to the measurement of PEDOT:PSS solutions.
Keywords :
Conductive polymer , resistivity , contact resistance , Transmission line method , Organic thin film transistor
Journal title :
Synthetic Metals
Serial Year :
2006
Journal title :
Synthetic Metals
Record number :
2083400
Link To Document :
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