Title of article :
Scanning tunneling microscopy studies of semiconductor surface structure and growth
Author/Authors :
Orr، نويسنده , , Bradford G، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
6
From page :
11
To page :
16
Abstract :
Scanning tunneling microscopy studies of film growth have centered on two areas: structural determination and surface dynamics. Advances have been made recently in the imaging of aperiodic structures such as defects and dopants. Dynamical studies are starting to produce real-time atomic resolution movies of surfaces during growth.
Journal title :
Current Opinion in Solid State and Materials Science
Serial Year :
1996
Journal title :
Current Opinion in Solid State and Materials Science
Record number :
2087685
Link To Document :
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