Title of article :
High resolution electron energy loss spectroscopy
Author/Authors :
Richardson، نويسنده , , Neville V، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
Electron energy loss spectroscopy, in the regime corresponding to losses < 500 meV, is now routinely exploited for the characterisation of material surfaces. Recent instrumental advances and improvements in data analysis enable the study of widely different materials and contributions to the solution of surface and near-surface problems, many of which have a technological importance in fields as diverse as semiconductor devices, molecular sensors and heterogeneous catalysis.
Journal title :
Current Opinion in Solid State and Materials Science
Journal title :
Current Opinion in Solid State and Materials Science