Title of article :
Studies of monolayers using synchrotron X-ray diffraction
Author/Authors :
Dutta، نويسنده , , Pulak، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
6
From page :
557
To page :
562
Abstract :
Diffraction of synchrotron X-rays is a powerful tool for studies of monolayers. In recent years, the emphasis of such studies has moved from physisorbed monolayers of rare gases or small molecules, to more extended molecules physisorbed or chemisorbed on liquid and solid surfaces. Diffraction studies of self-assembled and Langmuir films, successfully performed only during the past ten years, have dramatically increased our understanding of these scientifically and technologically important monolayer systems.
Journal title :
Current Opinion in Solid State and Materials Science
Serial Year :
1997
Journal title :
Current Opinion in Solid State and Materials Science
Record number :
2088278
Link To Document :
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