Title of article
Reaction kinetics in silicon chemical vapor deposition
Author/Authors
Tonokura، نويسنده , , Kenichi and Koshi، نويسنده , , Mitsuo، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
7
From page
479
To page
485
Abstract
Gas-phase reactions of simple silicon hydride species underlying many types of chemical vapor deposition processes for silicon-based thin-film growth are reviewed in this paper. Mass spectrometry and laser-based spectroscopy are applied to identify gas-phase intermediates in thermal and hot-wire chemical vapor deposition processes. The mechanism of the thermal decomposition of silanes, including reactions that lead to the formation of hydrogenated silicon clusters, is examined. The gas-phase chemical kinetic mechanism in hot-wire chemical vapor deposition is proposed to explain precursor molecules for the film growth.
Journal title
Current Opinion in Solid State and Materials Science
Serial Year
2002
Journal title
Current Opinion in Solid State and Materials Science
Record number
2088812
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