Title of article :
In situ studies of metal passive films
Author/Authors :
M. and Dيez-Pérez، نويسنده , , Ismael and Sanz، نويسنده , , Fausto and Gorostiza، نويسنده , , Pau، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
9
From page :
144
To page :
152
Abstract :
The understanding of metal passivation has greatly improved in the recent years due to the development of in situ experimental techniques. It is now possible to characterize at the nanoscale the chemical composition, structure and electronic properties of oxide films that grow on the surface of metals, while keeping them in solution and under potentiostatic control. This knowledge is allowing to elucidate the mechanisms of metal passivation and is providing great advances in the characterization of other dynamic, complex processes like passivity breakdown induced by chloride.
Keywords :
nickel , Copper , Iron , passivity , Semiconductor electrochemistry , Chloride corrosion , TIN , XRD , EIS , SERS , Electrochemical STM , XANES , ects , Oxide , Electrochemical tunneling spectroscopy , Voltammetry
Journal title :
Current Opinion in Solid State and Materials Science
Serial Year :
2006
Journal title :
Current Opinion in Solid State and Materials Science
Record number :
2089104
Link To Document :
بازگشت